Logic-Based Mega-Bit CuxSiyO emRRAM with Excellent Scalability Down to 22nm Node for post-emFLASH SOC Era
Yanliang Wang, Lin Yinyin(Semiconductor Manufacturing International (China)), Wenjin Luo(Shanghai Institute of Technical Physics), Ming Wang(Nanyang Technological University), Jingang Wu(Semiconductor Manufacturing International (China)), Ryan Huang(Semiconductor Manufacturing International (China)), Beiyuan Hu(Semiconductor Manufacturing International (China)), Lingming Yang(Fudan University), Qingtian Zou(The University of Texas Southwestern Medical Center)
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