Fully integrated 54nm STT-RAM with the smallest bit cell dimension for high density memory application

Suock Chung(SK Group (United States)), Sung-Joo Hong(SK Group (United States)), Sarim Kim(SK Group (United States)), H.-J. Kim(SK Group (United States)), Junrye Rho(SK Group (United States)), Junbeom Park(SK Group (United States)), Jeongbin Kim(SK Group (United States)), YoungBin Seo(SK Group (United States)), Dong-hyun Kim(SK Group (United States)), Dooyoung Jung(SK Group (United States)), M.-S. Lee(SK Group (United States)), V. Nikitin(Samsung (United States)), Yong-Ki Kim(SK Group (United States)), S. M. Hwang(SK Group (United States)), Geonhyeong Park(SK Group (United States)), Yerim An(SK Group (United States)), S.-H. Cho(SK Group (United States)), S.-H. Lee(SK Group (United States)), Hongju Suh(SK Group (United States)), Gyuan Jin(SK Group (United States)), K.-M. Rho(SK Group (United States)), X. Tang(West China Medical Center of Sichuan University), A. Driskill-Smith(Samsung (United States)), Jae Goan Jeong(SK Group (United States)), A. Ong(Samsung (United States)), Sihyeon Park(SK Group (United States)), Jeongho Yi(SK Group (South Korea)), Jongwon Lee(SK Group (United States)), Hyebeen Hwang(SK Group (United States)), Sun Woo Chung(SK Group (United States))
Unknown
December 1, 2010
Cited by 89


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