Compact Reconnaissance Imaging Spectrometer for Mars (CRISM) on Mars Reconnaissance Orbiter (MRO)

S. L. Murchie(Johns Hopkins University Applied Physics Laboratory), R. E. Arvidson(Washington University in St. Louis), P. Bedini(Johns Hopkins University Applied Physics Laboratory), K. Beißer(Johns Hopkins University Applied Physics Laboratory), Jean‐Pierre Bibring(Institut d'Astrophysique Spatiale), J. L. Bishop(Ames Research Center), J. Boldt(Johns Hopkins University Applied Physics Laboratory), P. J. Cavender(Johns Hopkins University Applied Physics Laboratory), T. Choo(Johns Hopkins University Applied Physics Laboratory), R. T. Clancy(Space Science Institute), E. H. Darlington(Johns Hopkins University Applied Physics Laboratory), David L. Des Marais(Ames Research Center), R. C. Espiritu(Applied Coherent Technology (United States)), D. Fort(Johns Hopkins University Applied Physics Laboratory), R. Green(Jet Propulsion Laboratory), E. A. Guinness(Washington University in St. Louis), J. R. Hayes(Johns Hopkins University Applied Physics Laboratory), C. Hash(Applied Coherent Technology (United States)), K. J. Heffernan(Johns Hopkins University Applied Physics Laboratory), J. Hemmler(Johns Hopkins University Applied Physics Laboratory), Gene A. Heyler(Johns Hopkins University Applied Physics Laboratory), D. C. Humm(Johns Hopkins University Applied Physics Laboratory), Joel C. Hutcheson(Johns Hopkins University Applied Physics Laboratory), N. R. Izenberg(Johns Hopkins University Applied Physics Laboratory), R. Lee(Johns Hopkins University Applied Physics Laboratory), Jeffrey Lees(Johns Hopkins University Applied Physics Laboratory), D. Lohr(Johns Hopkins University Applied Physics Laboratory), E. Malaret(Applied Coherent Technology (United States)), T. Z. Martin(Jet Propulsion Laboratory), J. A. McGovern(Johns Hopkins University Applied Physics Laboratory), Patrick McGuire(Washington University in St. Louis), R. V. Morris(Johnson Space Center), John F. Mustard(Brown University), S. M. Pelkey(Brown University), E. A. Rhodes(Johns Hopkins University Applied Physics Laboratory), M. S. Robinson(Northwestern University), T. Roush(Ames Research Center), Edward D. Schaefer(Johns Hopkins University Applied Physics Laboratory), Gordon G. Seagrave(Johns Hopkins University Applied Physics Laboratory), F. P. Seelos(Johns Hopkins University Applied Physics Laboratory), Peter R. Silverglate(Johns Hopkins University Applied Physics Laboratory), S. Slavney(Washington University in St. Louis), M. D. Smith(Goddard Space Flight Center), Wen-Jong Shyong(Johns Hopkins University Applied Physics Laboratory), K. Strohbehn(Johns Hopkins University Applied Physics Laboratory), H. W. Taylor(Johns Hopkins University Applied Physics Laboratory), Patrick L. Thompson(Johns Hopkins University Applied Physics Laboratory), B. E. Tossman(Johns Hopkins University Applied Physics Laboratory), M. Wirzburger(Johns Hopkins University Applied Physics Laboratory), M. J. Wolff(Space Science Institute)
Journal of Geophysical Research Atmospheres
May 1, 2007
10.1029/2006je002682
Cited by 1,081Open Access
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Abstract

The Compact Reconnaissance Imaging Spectrometer for Mars (CRISM) is a hyperspectral imager on the Mars Reconnaissance Orbiter (MRO) spacecraft. CRISM consists of three subassemblies, a gimbaled Optical Sensor Unit (OSU), a Data Processing Unit (DPU), and the Gimbal Motor Electronics (GME). CRISM's objectives are (1) to map the entire surface using a subset of bands to characterize crustal mineralogy, (2) to map the mineralogy of key areas at high spectral and spatial resolution, and (3) to measure spatial and seasonal variations in the atmosphere. These objectives are addressed using three major types of observations. In multispectral mapping mode, with the OSU pointed at planet nadir, data are collected at a subset of 72 wavelengths covering key mineralogic absorptions and binned to pixel footprints of 100 or 200 m/pixel. Nearly the entire planet can be mapped in this fashion. In targeted mode the OSU is scanned to remove most along‐track motion, and a region of interest is mapped at full spatial and spectral resolution (15–19 m/pixel, 362–3920 nm at 6.55 nm/channel). Ten additional abbreviated, spatially binned images are taken before and after the main image, providing an emission phase function (EPF) of the site for atmospheric study and correction of surface spectra for atmospheric effects. In atmospheric mode, only the EPF is acquired. Global grids of the resulting lower data volume observations are taken repeatedly throughout the Martian year to measure seasonal variations in atmospheric properties. Raw, calibrated, and map‐projected data are delivered to the community with a spectral library to aid in interpretation.

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