Capacitance–Voltage Characterization of GaAs–Oxide Interfaces
Guy Brammertz(IMEC), M. M. Heyns(IMEC), Koen Martens(IMEC), Sonja Sioncke(IMEC), Matty Caymax(IMEC), Clément Merckling(IMEC), Christoph Adelmann(Imec the Netherlands), J. Penaud(Fraunhofer Institute for Nondestructive Testing), Marc Meuris(IMEC), H. C. Lin(IMEC), David Mercier(IMEC), W. E. Wang(IMEC)
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