45nm High-k + metal gate strain-enhanced transistors
C. Auth(Intel (United States)), C. Wiegand(Intel (United States)), F. Tambwe(Intel (United States)), Jang‐Soo Chun(Gwangju Institute of Science and Technology), Adam Dalis(Intel (United States)), J. Sandford(Intel (United States)), Jami Wiedemer(Intel (United States)), V. Souw(Intel (United States)), Kelin J. Kuhn(Intel (United States)), K. Mistry(Intel (United States)), L. Shifren(Intel (United States)), S. Jaloviar(Intel (United States)), Alexander Davis(Intel (United States)), B. Norris(Intel (United States)), S. Joshi(Northwestern University), M. Hattendorf(Intel (United States)), Charles H. Wallace(Intel (United States)), Alan J. Thompson(Queen Mary University of London), Mei-Chien Lu(Intel (United States)), G. Glass(Intel (United States)), A. Cappellani(Intel (United States)), P. Hentges(Intel (United States)), D. Lavric(Intel (United States)), T. Troeger(Intel (United States)), T. Ghani(Intel (United States)), P. Ranade(University of California, Berkeley), H. Mariappan(Intel (United States)), P. Vandervoorn(Intel (United States)), D. J. Towner(Intel (United States)), M. Harper(Intel (United States)), K. Tone(Intel (United States)), N. Rahhal-orabi(Intel (United States)), J. W. Klaus(Intel (United States)), Timothy E. Glassman(Intel (United States))
Cited by 204
Related Papers
Diagnostic criteria for multiple sclerosis: 2010 Revisions to the McDonald criteria
|Annals of Neurology|2011|9.8k
Diagnosis of multiple sclerosis: 2017 revisions of the McDonald criteria
|The Lancet Neurology|2017|8k
Recommended diagnostic criteria for multiple sclerosis: Guidelines from the international panel on the diagnosis of multiple sclerosis
|Annals of Neurology|2001|7k
Diagnostic criteria for multiple sclerosis: 2005 revisions to the “McDonald Criteria”
|Annals of Neurology|2005|5k
Defining the clinical course of multiple sclerosis
|Neurology|2014|3.1k