Reverse gate bias-induced degradation of AlGaN/GaN high electron mobility transistors
Chih-Yang Chang(University of Florida), S. J. Pearton(University of Florida), Lu Liu(University of Florida), K. S. Jones(University of Florida), R. H. Holzworth(University of Washington), Travis J. Anderson(University of Florida), Patrick Whiting(University of Florida), G. D. Via(Wright-Patterson Air Force Base), E Douglas(Sandia National Laboratories), F. Ren(University of Florida), David Cheney(University of Florida), Byung-Hwan Chu(University of Florida), Jennifer K. Hite(United States Naval Research Laboratory), Chien-Fong Lo(University of Florida), Soohwan Jang(Dankook University)
Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
September 1, 2010
Cited by 26
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