Ambient-controlled scanning spreading resistance microscopy measurement and modeling

Shu Qin(Micron (United States)), Allen McTeer(Micron (United States)), David Fillmore(Micron (United States)), Zhiyong Suo(Micron (United States)), Yongjun Hu(South China Normal University), Shi-Feng Lu(Micron (United States))
Applied Physics Letters
December 23, 2013
Cited by 10


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