EUV spectral lines of highly-charged Hf, Ta and Au ions observed with an electron beam ion trap

Ilija N Draganić(National Institute of Standards and Technology), D. Osin(Tokamak Energy (United Kingdom)), J. D. Gillaspy(National Institute of Standards and Technology), J. M. Pomeroy(National Institute of Standards and Technology), Samuel M. Brewer(National Institute of Standards and Technology), Joseph Reader(National Institute of Standards and Technology), Joseph N. Tan(National Institute of Standards and Technology), Yuri Ralchenko(National Institute of Standards and Technology)
Journal of Physics B Atomic Molecular and Optical Physics
January 12, 2011
10.1088/0953-4075/44/2/025001
Cited by 27

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