Frequency ratio measurements at 18-digit accuracy using an optical clock network
K. Beloy(National Institute of Standards and Technology), X. Zhang(National Institute of Standards and Technology), Dhruv Kedar(National Institute of Standards and Technology), Jwo-Sy Chen(National Institute of Standards and Technology), Tobias Bothwell(National Institute of Standards and Technology), Tara M. Fortier(National Institute of Standards and Technology), Robert Fasano(National Institute of Standards and Technology), Jian Yao(National Institute of Standards and Technology), Daniele Nicolodi(National Institute of Standards and Technology), Scott A. Diddams(National Institute of Standards and Technology), Holly Leopardi(National Institute of Standards and Technology), Martha I. Bodine(National Institute of Standards and Technology), William F. McGrew(National Institute of Standards and Technology), Isaac Khader(National Institute of Standards and Technology), Laura C. Sinclair(National Institute of Standards and Technology), Nathan R. Newbury(National Institute of Standards and Technology), Andrew D. Ludlow(National Institute of Standards and Technology), John Robinson(National Institute of Standards and Technology), Colin J. Kennedy(National Institute of Standards and Technology), E. Oelker(National Institute of Standards and Technology), Stefan Alaric Schäffer(National Institute of Standards and Technology), Youssef S. Hassan(National Institute of Standards and Technology), David R. Leibrandt(National Institute of Standards and Technology), T.E. Parker(National Institute of Standards and Technology), Samuel M. Brewer(National Institute of Standards and Technology), Sarah Bromley(National Institute of Standards and Technology), David Hume(National Institute of Standards and Technology), William C. Swann(National Institute of Standards and Technology), Lindsay Sonderhouse(Joint Institute for Laboratory Astrophysics), Stefania Romisch(National Institute of Standards and Technology), Jun Ye(National Institute of Standards and Technology), Jean-Daniel Deschênes, A. Sophia Koepke(National Institute of Standards and Technology), Jeffrey A. Sherman(National Institute of Standards and Technology), William R. Milner(Joint Institute for Laboratory Astrophysics)
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