Frequency ratio measurements at 18-digit accuracy using an optical clock network
K. Beloy(National Institute of Standards and Technology), X. Zhang(Atom Computing (United States)), Dhruv Kedar(National Institute of Standards and Technology), Jwo-Sy Chen(IonQ (United States)), Tobias Bothwell(National Institute of Standards and Technology), Tara M. Fortier(National Institute of Standards and Technology), Robert Fasano(National Institute of Standards and Technology), Jian Yao(National Institute of Standards and Technology), Daniele Nicolodi(National Institute of Standards and Technology), Scott A. Diddams(University of Colorado Boulder), Holly Leopardi(Goddard Space Flight Center), Martha I. Bodine(National Institute of Standards and Technology), William F. McGrew(National Institute of Standards and Technology), Isaac Khader(National Institute of Standards and Technology), Laura C. Sinclair(National Institute of Standards and Technology), Nathan R. Newbury(University of California San Diego), Andrew D. Ludlow(National Institute of Standards and Technology), John Robinson(National Institute of Standards and Technology), Colin J. Kennedy(MIT-Harvard Center for Ultracold Atoms), E. Oelker(Massachusetts Institute of Technology), Stefan Alaric Schäffer(National Institute of Standards and Technology), Youssef S. Hassan(National Institute of Standards and Technology), David R. Leibrandt(National Institute of Standards and Technology), T.E. Parker(National Institute of Standards and Technology), Samuel M. Brewer(National Institute of Standards and Technology), Sarah Bromley(National Institute of Standards and Technology), David Hume(National Institute of Standards and Technology), William C. Swann(National Institute of Standards and Technology), Lindsay Sonderhouse(Joint Institute for Laboratory Astrophysics), Stefania Romisch(National Institute of Standards and Technology), Jun Ye(National Institute of Standards and Technology), Jean-Daniel Deschênes, A. Sophia Koepke(National Institute of Standards and Technology), Jeffrey A. Sherman(National Institute of Standards and Technology), William R. Milner(National Institute of Standards and Technology)
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