Random telegraph noise analysis in AlOx/WOy resistive switching memories

Ye Zhang(Beijing Microelectronics Technology Institute), He Qian(University of Science and Technology of China), Huaqiang Wu(Beijing Advanced Sciences and Innovation Center), Ning Deng(Fujitsu (China)), Jinyu Zhang(Institute of Microelectronics), Zhiping Yu(Beijing Microelectronics Technology Institute), Minghao Wu(Institute of Microelectronics)
Applied Physics Letters
March 10, 2014
10.1063/1.4868383
Cited by 26

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