Variation-tolerant Cu<sub>x</sub>Si<sub>y</sub>O-based RRAM for low power application
Wenxiang Jian(Fudan University), Jingang Wu(Semiconductor Manufacturing International (China)), Qingtian Zou(The University of Texas Southwestern Medical Center), Gang Jin(China Aerodynamics Research and Development Center), Na Yan(Fudan University), Yinyin Lin(Fudan University), Zhongyu Bi(Fudan University), Ryan Huang(Semiconductor Manufacturing International (China)), Hao Min(Fudan University)
Cited by 1
Related Papers
DeepSyslog: Deep Anomaly Detection on Syslog Using Sentence Embedding and Metadata
|IEEE Transactions on Information Forensics and Security|2022|56
Using deep learning to solve computer security challenges: a survey
|Cybersecurity|2020|43
A 0.13 µm 8 Mb Logic-Based Cu$_{\rm x}$Si$_{\rm y}$O ReRAM With Self-Adaptive Operation for Yield Enhancement and Power Reduction
|IEEE Journal of Solid-State Circuits|2013|42
Si–Sb–Te films for phase-change random access memory
|Semiconductor Science and Technology|2006|30
A Logic Resistive Memory Chip for Embedded Key Storage With Physical Security
|IEEE Transactions on Circuits & Systems II Express Briefs|2015|26