Twenty-five nm features patterned with trilevel e-beam resist

D. M. Tennant(University of Tennessee at Knoxville), B. S. Schneider, Evelyn L. Hu(Harvard University Press), L. D. Jackel, R. E. Howard, R.J. Capik, P. Grabbe
Journal of Vacuum Science and Technology
November 1, 1981
Cited by 26


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