Discrete Resistance Switching in Submicrometer Silicon Inversion Layers: Individual Interface Traps and Low-Frequency (<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mfrac><mml:mrow><mml:mn>1</mml:mn></mml:mrow><mml:mrow><mml:mi>f</mml:mi></mml:mrow></mml:mfrac></mml:math>?) Noise

K. S. Ralls, D. M. Tennant(University of Tennessee at Knoxville), R. W. Epworth, W. J. Skocpol(TKL Research), L. D. Jackel, Richard Howard(Samsung (United States)), Linus A. Fetter
Physical Review Letters
January 16, 1984
Cited by 711


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