Reflectancevs. Electroreflectance measurements on arsenic-doped silicon crystal
A. Borghesi(Inserm), E. Rimini(University of Catania), U. Campisano(University of Catania), D. Maghini(University of Pavia), G. Guizzetti(University of Pavia), M. Geddo(University of Parma), A. Stella(Istituto Nazionale di Fisica Nucleare, Sezione di Pavia)
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