Process optimization for production of sub-20 nm soft x-ray zone plates

S. J. Spector(Alcatel Lucent (Germany)), D. M. Tennant(University of Tennessee at Knoxville), Chris Jacobsen(Argonne National Laboratory)
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena
November 1, 1997
Cited by 125


Related Papers