AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress
E Douglas(Sandia National Laboratories), S. J. Pearton(University of Florida), K. S. Jones(University of Florida), R. H. Holzworth(University of Washington), Patrick Whiting(University of Florida), G. D. Via(Wright-Patterson Air Force Base), F. Ren(University of Florida), Jin-Hyung Kim(Dankook University), Chin‐Wei Chang(University of Florida), David Cheney(University of Florida), Soohwan Jang(Dankook University), C. F. Lo(University of Florida), Lu Liu(University of Florida)
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