Transmission electron microscopy investigation of the crystallographic quality of silicon films grown epitaxially on porous silicon
S. Jin(IMEC), Matty Caymax(IMEC), L. Stalmans(IMEC), R. Bilyalov(IMEC), H. Bender(IMEC), Jef Poortmans(IMEC), Roger Loo(IMEC)
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