Electrochemical simulation of filament growth and dissolution in conductive-bridging RAM (CBRAM) with cylindrical coordinates

Sen Lin(Beijing University of Posts and Telecommunications), Zhiping Yu(Beijing Microelectronics Technology Institute), Huaqiang Wu(Tsinghua University), He Qian(University of Science and Technology of China), Yan Wang, Jinyu Zhang(Institute of Microelectronics), Liang Zhao(Soochow University)
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December 1, 2012
Cited by 14


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