A non-destructive deep interface characterization technique for multilayer films
Mihaela Gorgoi(Helmholtz-Zentrum Berlin für Materialien und Energie), W. Eberhardt(Goethe University Frankfurt), Olof Karis(Uppsala University), Erik Holmström(Los Alamos National Laboratory), Weine Olovsson(Kyoto University), Gabriella Andersson(Uppsala University), Moreno Marcellini(Uppsala University), E. Schafers, P. R. Bressler, Wolfgang Braun, S. Svensson(Uppsala University), Anders M. N. Niklasson(Uppsala University), G. Öhrwall(Uppsala University), Igor A. Abrikosov(Linköping University), N. Mårtensson, Börje Johansson(Uppsala University)
Journal of Electron Spectroscopy and Related Phenomena
January 1, 2007
Cited by 0
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