Sample Preserving Deep Interface Characterization TechniqueErik Holmström, W. Eberhardt, F. Schäfers et al.|Physical Review Letters|2006Cited by 41
Investigation of interface properties of Ni/Cu multilayers by high kinetic energy photoelectron spectroscopySari Granroth, N. Mårtensson, Ronny Knut et al.|Physical Review B|2009Cited by 21
A non-destructive deep interface characterization technique for multilayer filmsMihaela Gorgoi, W. Eberhardt, Olof Karis et al.|Journal of Electron Spectroscopy and Related Phenomena|2007Cited by 0
Interface characterization using atomic core-level shiftsErik Holmström, W. Eberhardt, Börje Johansson et al.|APS March Meeting Abstracts|2008Cited by 0