A non-destructive deep interface characterization technique for multilayer filmsMihaela Gorgoi, W. Eberhardt, Olof Karis et al.|Journal of Electron Spectroscopy and Related Phenomena|2007Cited by 0
HIKE experiments at KMC-1: Recent Analysis of Thin Film NanocompositesErik Lewin, Wolfgang Eberhardt, Erik Johansson et al.|Unknown|2007Cited by 0
HIKE experiments at KMC-1: Studies of Solar Cell MaterialsE Johansson, Wolfgang Eberhardt, Erik Lewin et al.|Unknown|2007Cited by 0
Interface characterization using atomic core-level shiftsErik Holmström, W. Eberhardt, Weine Olovsson et al.|APS March Meeting Abstracts|2008Cited by 0