Spectroscopic XPEEM of highly conductive SI-doped GaN wiresO. Renault, C. M. Schneider, Jean‐François Morin et al.|Ultramicroscopy|2015Cited by 7
Bi$_{\mathrm{1}}$Te$_{\mathrm{1}}$: A New Dual Topological InsulatorŁukasz Pluciński, C. M. Schneider, Markus Eschbach et al.|Bulletin of the American Physical Society|2017Cited by 0
Bi 1 Te 1 : A New Dual Topological InsulatorŁukasz Pluciński, C. M. Schneider, Markus Eschbach et al.|APS March Meeting Abstracts|2017Cited by 0