Spectroscopic XPEEM of highly conductive SI-doped GaN wires

O. Renault(Institut polytechnique de Grenoble), C. M. Schneider(Jülich Aachen Research Alliance), Jean‐François Morin(Jewish General Hospital), Nicolas Chevalier(Inserm), Julien Pernot(Institut polytechnique de Grenoble), Pierre Tchoulfian(Institut polytechnique de Grenoble), Vitaliy Feyer(Jülich Aachen Research Alliance)
Ultramicroscopy
May 13, 2015
Cited by 7


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