A study on interface traps and near interfacial bulk traps at the interfaces of dielectric/semiconductor and semiconductor heterojunctionChun Meng Dou, Chunmeng Dou|Medical Entomology and Zoology|2014Cited by 3
誘電体/半導体と半導体ヘテロ接合界面における界面トラップおよび界面近傍のバルクトラップに関する研究Chun Meng Dou, Chunmeng Dou|Institutional Repositories DataBase (IRDB)|2014Cited by 0
Determination of oxide traps distribution in high-k/InGaAs MOS capacitor by capacitance-voltage measurementChun Meng Dou, H Iwai, Chunmeng Dou et al.|Institutional Repositories DataBase (IRDB)|2014Cited by 0
Influence of Electrode Material for CaOx Based Resistive SwitchingChun Meng Dou, H Iwai, 邦之 角嶋 et al.|Institutional Repositories DataBase (IRDB)|2012Cited by 0