Hard x-ray photoelectron spectroscopy study of the buried Si/ZnO thin-film solar cell interface: Direct evidence for the formation of Si–O at the expense of Zn-O bondsM. Wimmer, B. Rech, W. Eberhardt et al.|Applied Physics Letters|2011Cited by 31
The silicon/zinc oxide interface in amorphous silicon-based thin-film solar cells: Understanding an empirically optimized contactD Gerlach, Marcus Bär, Regan G. Wilks et al.|Applied Physics Letters|2013Cited by 14
Chemical interaction at the buried silicon/zinc oxide thin-film solar cell interface as revealed by hard X-ray photoelectron spectroscopyM. Wimmer, Marcus Bär, D Gerlach et al.|Journal of Electron Spectroscopy and Related Phenomena|2013Cited by 5
p-Type a-Si:H/ZnO:Al and μc-Si:H/ZnO:Al Thin-Film Solar Cell Structures—A Comparative Hard X-Ray Photoelectron Spectroscopy StudyD Gerlach, K. Lips, B. Rech et al.|IEEE Journal of Photovoltaics|2012Cited by 5
p-Type a-Si:H/ZnO:Al and µc-Si:H/ZnO:Al thin-film solar cell structures—A comparative hard X-ray photoelectron spectroscopy studyD Gerlach, Marcus Bär, D. Wippler et al.|2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2|2012Cited by 1