A new soft breakdown model for thin thermal SiO/sub 2/ films under constant current stressTakashi Tomita, Kenji Taniguchi, Hiroto Utsunomiya et al.|IEEE Transactions on Electron Devices|1999Cited by 64
A detailed study of soft- and pre-soft-breakdowns in small geometry MOS structuresT. Sakura, Kenji Taniguchi, Hiroto Utsunomiya et al.|Unknown|2002Cited by 49
Hot hole induced breakdown of thin silicon dioxide filmsTakayuki Tomita, Kenji Taniguchi, Hiroto Utsunomiya et al.|Applied Physics Letters|1997Cited by 23
Investigations of hot-carrier-induced breakdown of thin oxidesYoshinari Kamakura, Kenji Taniguchi, Kazunori Umeda et al.|Unknown|2002Cited by 19