Scanning Single-Electron Transistor Microscopy: Imaging Individual ChargesM. J. Yoo, K. W. West, L. N. Dunkleberger et al.|Science|1997Cited by 322
Microscopy with a single electron transistor probeHarald F. Hess, Amir Yacoby, T. A. Fulton et al.|Solid State Communications|1998Cited by 10
Scanning single-electron transistor microscopy: Imaging individual chargesM. J. Yoo, K. W. West, T. A. Fulton et al.|Physica E Low-dimensional Systems and Nanostructures|1998Cited by 5
Scanning Single Electron Transistor Microscopy: Imaging Individual ChargesM. J. Yoo, K. W. West, L. N. Pfeiffer et al.|Unknown|1998Cited by 4