Scanning single-electron transistor microscopy: Imaging individual charges
M. J. Yoo, K. W. West(Princeton University), L. N. Pfeiffer(Alcatel Lucent (Germany)), L. N. Dunkleberger, R. J. Chichester, T. A. Fulton, R. L. Willett(Massachusetts Institute of Technology), Harald F. Hess(Janelia Research Campus)
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