Concentration profiling using x-ray reflectivity: Application to Cu-Al interfacesHuaiyu Chen, Steve M. Heald|Journal of Applied Physics|1989Cited by 40
Glancing angle XAFS and X-ray reflectivity studies of transition-metal/aluminium interfacesSteve M. Heald, Huaiyu Chen, Enrique V. Barrera|Faraday Discussions of the Chemical Society|1990Cited by 11
Reaction and diffusion at Cu/Al interfaces studied using glancing-angle extended x-ray-absorption fine structuresHuaiyu Chen, Steve M. Heald|Physical review. B, Condensed matter|1990Cited by 8
Comparison of glancing angle extended x-ray absorption fine structure obtained from fluorescence and reflectivity measurementsHuaiyu Chen, Steve M. Heald|Journal of Applied Physics|1993Cited by 5