Concentration profiling using x-ray reflectivity: Application to Cu-Al interfaces

Huaiyu Chen(Lund University), Steve M. Heald(Argonne National Laboratory)

Journal of Applied Physics

August 15, 1989

10.1063/1.344350

Cited by 40

Related Papers

(De)Lithiation Mechanism of Li/SeS<sub><i>x</i></sub> (<i>x</i> = 0–7) Batteries Determined by in Situ Synchrotron X-ray Diffraction and X-ray Absorption Spectroscopy

|Journal of the American Chemical Society|2013|387

Direct Kinetic Correlation of Carriers and Ferromagnetism in<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:msup><mml:mi>Co</mml:mi><mml:mrow><mml:mn>2</mml:mn><mml:mo>+</mml:mo></mml:mrow></mml:msup><mml:mtext mathvariant="normal">:</mml:mtext><mml:mtext> </mml:mtext><mml:mtext> </mml:mtext><mml:mi>ZnO</mml:mi></mml:math>

|Physical Review Letters|2006|295

X-ray filter assembly for fluorescence measurements of x-ray absorption fine structure

|Review of Scientific Instruments|1979|272

Strong Room-Temperature Ferromagnetism in Co<sup>2+</sup>-Doped TiO<sub>2</sub> Made from Colloidal Nanocrystals

|Journal of the American Chemical Society|2004|232

Understanding the Effects of Concentration on the Solvation Structure of Ca<sup>2+</sup> in Aqueous Solution. I: The Perspective on Local Structure from EXAFS and XANES

|The Journal of Physical Chemistry A|2003|230