Microstructure evolution and hard x-ray reflectance of ultrathin Ru/C multilayer mirrors with different layer thicknessesYang Liu, Zhanshan Wang, Liangxing Xiao et al.|Materials Research Express|2021Cited by 18
A table-top EUV focusing optical system with high energy density using a modified Schwarzschild objective and a laser-plasma light sourceZhe Zhang, Zhanshan Wang, Henryk Fiedorowicz et al.|Review of Scientific Instruments|2018Cited by 15
Improving Thickness Uniformity of Mo/Si Multilayers on Curved Spherical Substrates by a Masking TechniqueZhe Zhang, Chun Xie, Yingna Shi et al.|Coatings|2019Cited by 13
Time-resolved multispectral X-ray imaging with multi-channel Kirkpatrick-Baez microscope for plasma diagnostics at Shenguang-II laser facilityShengzhen Yi, Sizu Fu Sizu Fu, Jingtao Zhu Jingtao Zhu et al.|Chinese Optics Letters|2014Cited by 8