Transfer Learning-Based Artificial Intelligence-Integrated Physical Modeling to Enable Failure Analysis for 3 Nanometer and Smaller Silicon-Based CMOS TransistorsJieming Pan, Aaron Thean, Evgeny Zamburg et al.|ACS Applied Nano Materials|2021Cited by 46
Physical Insights into Vacancy-Based Memtransistors: Toward Power Efficiency, Reliable Operation, and ScalabilityMaheswari Sivan, Aaron Thean, Joydeep Ghosh et al.|ACS Nano|2022Cited by 30