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Reliability-Aware Ultra-Scaled IDG-InGaZnO-FET Compact Model to Enable Cross-layer Co-design for Highly Efficient Analog Computing in 2T0C-DRAMLihua Xu, Ming Liu, Kaifei Chen et al.|Unknown|2023Cited by 11
Binary‐Stochasticity‐Enabled Highly Efficient Neuromorphic Deep Learning Achieves Better‐than‐Software AccuracyYang Li, Ming Liu, Wei Wang et al.|Advanced Intelligent Systems|2023Cited by 7
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