Characterization of trapping force in the presence of spherical aberrationPu Chun Ke, Min Gu|Journal of Modern Optics|1998Cited by 6
Effect of the sample condition on the enhanced evanescent wave used for laser-trapping near-field microscopyPu Chun Ke, Min Gu|Unknown|1998Cited by 3
Optical beam lithography beyond the diffraction limitMin Gu, Richard A. Evans, Zongsong Gan et al.|SPIE Newsroom|2013Cited by 0