Heavy ion induced upset errors in 90-nm 64 Mb NOR-type floating-gate Flash memoryJinshun Bi, Ming Liu, Lanlong Ji et al.|Chinese Physics B|2018Cited by 14
Beyond macroscopic performance: nanoscale charge transfer dynamics in energy storage/conversion devices <i>via</i> scanning electrochemical cell microscopyZhenjiang Cao, Kai Xi, Pengfei Li et al.|Chemical Communications|2025Cited by 8