Heavy ion induced upset errors in 90-nm 64 Mb NOR-type floating-gate Flash memory

Jinshun Bi(Chinese Academy of Sciences), Ming Liu(China Academy of Space Technology), Jin Li(Shenyang Medical College), Haibin Wang(Hohai University), Lanlong Ji(Chinese Academy of Sciences), Kai Xi(Chinese Academy of Sciences), Bo Li(Chinese Academy of Sciences)
Chinese Physics B
September 1, 2018
10.1088/1674-1056/27/9/098501
Cited by 14

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