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Oxidation of NiFe(20 wt.%) thin filmsW. Brückner, Claus M. Schneider, S. Baunack et al.|Materials Science and Engineering B|2001Cited by 29
Interdiffusion, stress, and microstructure evolution during annealing in Co/Cu/Co trilayersW. Brückner, Claus M. Schneider, S. Baunack et al.|Journal of Applied Physics|2002Cited by 10
TEM–EELS investigations of nanoscale multilayers in the linescan modeK. Wetzig, Andreas John, J. Thomas et al.|Journal of Electron Spectroscopy and Related Phenomena|2001Cited by 2