Failure analysis on MIMCAP failures of 10nm devices using phase angle measurement methodHsu Li khoo, Siew Ming Lim, Chiun Ning Liew et al.|Unknown|2022Cited by 3
Effective Defect Localization for Scan ATPG Failure through Layout Aware AnalysisJack Yi Jie Ng, Lee Kean Yong, Kok Heng Lau et al.|Unknown|2022Cited by 0
Internal Power Net Defect Localization Via Holistic Fault Isolation With FIB Edit Pico ProbeKok Heng Lau, Jack Yi Jie Ng, Chiun Ning Liew et al.|Unknown|2022Cited by 0