Quantum Conductance in Vertical Hexagonal Boron Nitride Memristors with Graphene-Edge ContactsJing Xie, Ivan Sanchez Esqueda, Nicholas D. Ignacio et al.|Nano Letters|2024Cited by 23
Electron‐Beam Excited Conductive Atomic Force Microscopy for Back Contact Free, Wafer‐Scale and In‐Line Compatible Electrical Characterization of 2D MaterialsMd Ashiqur Rahman Laskar, Umberto Celano, Fabrizio Toia et al.|Advanced Science|2025Cited by 2