24.7% Record Efficiency HIT Solar Cell on Thin Silicon WaferMikio Taguchi, Ayumu Yano, Satoshi Tohoda et al.|IEEE Journal of Photovoltaics|2013 A new record conversion efficiency of 24.7% was attained at the research level by using a heterojunction with intrinsic thin-layer structure of practical size (101.8 cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> , total area) at a 98-μm thickness. This is a world height record for any crystalline silicon-based solar cell of practical size (100 cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> and above). Since we announced our former record of 23.7%, we have continued to reduce recombination losses at the hetero interface between a-Si and c-Si along with cutting down resistive losses by improving the silver paste with lower resistivity and optimization of the thicknesses in a-Si layers. Using a new technology that enables the formation of a-Si layer of even higher quality on the c-Si substrate, while limiting damage to the surface of the substrate, the V <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">oc</sub> has been improved from 0.745 to 0.750 V. We also succeeded in improving the fill factor from 0.809 to 0.832.
Future directions for higher-efficiency HIT solar cells using a Thin Silicon WaferSatoshi Tohoda, Daisuke Fujishima, Ayumu Yano et al.|Journal of Non-Crystalline Solids|2012 Interface atomic structures and magnetic anisotropy of Fe and Pd/Fe monatomic films on Pd(001)The magnetic anisotropy of monatomic Fe films on Pd(001) with or without a Pd overlayer was investigated from the standpoint of interface atomic structures. Quantitative analysis included low-energy electron diffraction and x-ray magnetic circular dichroism (XMCD) experiments, and first-principles calculations were also performed on monatomic Fe and Pd/Fe systems. It was revealed that Fe atoms intermix with the Pd substrate at room temperature. A spin reorientation transition occurs at a critical Fe thickness of 1.2 monolayers (ML) in Fe/Pd(001), while in-plane magnetic anisotropy is persistent in Pd/Fe/Pd(001) throughout the entire sample. The Fe 3$d$ spin and orbital magnetic moments for both systems are strongly enhanced near 1 ML Fe thickness, as compared to those of the bulk iron crystal. In addition, an induced magnetic moment in interfacial Pd atoms was observed by XMCD at the Pd ${M}_{2,3}$ core absorption edges. It was concluded that the $L{1}_{0}$-like tetragonally distorted interface atomic structure in monatomic Fe/Pd(001) induces the perpendicular magnetic anisotropy.
Spin Reorientation Transition of Fe Ultra-Thin Films on Pd(001) Studied by X-Ray Magnetic Circular Dichroism SpectroscopyTetsuro Ueno, M. Nagira, Satoshi Tohoda et al.|e-Journal of Surface Science and Nanotechnology|2008 We investigated the magnetic anisotropy of bare and Pd-capped Fe ultra-thin films on the Pd(001) single crystal substrate using soft X-ray magnetic circular dichroism (XMCD) spectroscopy. XMCD spectra indicate that the spin reorientation transition (SRT) occurs in Fe/Pd(001). It is suggested that the SRT in Fe/Pd(001) is related to the film morphology. In Pd/Fe/Pd(001), in-plane magnetic anisotropy was observed. No evidence of perpendicular magnetic anisotropy was obtained, which is in contrast to the L10-ordered FePd alloy. [DOI: 10.1380/ejssnt.2008.246]
Growth Mode and Surface Structure of Cr Ultrathin Film on Fe/Cu(001)Satoshi Tohoda, M. Nagira, Tetsuro Ueno et al.|e-Journal of Surface Science and Nanotechnology|2008 We hereby report a growth mode and surface structure of ultrathin Cr films on fcc Fe/Cu(001). We have found a clear RHEED intensity oscillation during Cr deposition up to four monolayers on 3 and 6 ML Fe/Cu(001), indicating an layer-by-layer growth. Besides, the observed (2×1) LEED pattern at low Cr thickness is similar to that of fcc Fe/Cu(001) in the 5-11 ML thickness range. We have also demonstrated the Cr/Fe multilayer growth with single monolayer of Cr inserted between fcc Fe layers. [DOI: 10.1380/ejssnt.2008.251]