High efficient low cost EEPROM screening method in combination with an area optimized byte replacement strategy which enables high reliability EEPROMsGregor Schatzberger, Andreas Wiesner, F.P. Leisenberger et al.|Unknown|2018Cited by 5
Fully Automatical Test and Qualification System for a High Endurance Embedded EEPROM ModuleJohannes Fellner, Andreas Wiesner, Gregor Schatzberger|Unknown|2008Cited by 2
Fully Automatical TestandQualification System foraHighEndurance EmbeddedEEPROM ModuleJohannes Fellner, Andreas Wiesner, Gregor Schatzberger|Unknown|2008Cited by 0