High efficient low cost EEPROM screening method in combination with an area optimized byte replacement strategy which enables high reliability EEPROMs

Gregor Schatzberger(AMS (Austria)), Andreas Wiesner(Centre National de la Recherche Scientifique), F.P. Leisenberger(AMS (Austria)), Peter Sarson(AMS (Austria))
Unknown
April 1, 2018
Cited by 5


Related Papers