On the tip calibration for accurate modulus measurement by contact resonance atomic force microscopyDaniele Passeri, Joost J. Vlassak, Marco Rossi|Ultramicroscopy|2013Cited by 30
Local indentation modulus characterization via two contact resonance frequencies atomic force acoustic microscopyDaniele Passeri, Joost J. Vlassak, Marco Rossi et al.|Microelectronic Engineering|2006Cited by 23
Contact resonance atomic force microscopy (CR-AFM) in applied mineralogy: the case of natural and thermally treated diasporeDaniele Passeri, D. Ajó, Melania Reggente et al.|European Journal of Mineralogy|2016Cited by 8