Inspection of nano-sized SNOM-tips by optical far-field evaluationSoenke Seebacher, N.B. Voznessenski, Wolfgang Osten et al.|Optics and Lasers in Engineering|2001Cited by 5
Determination of geometric properties of SNOM tips by means of combined far-field and near-field evaluation.Soenke Seebacher, N.B. Voznessenski, Werner P. O. Jueptner et al.|Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE|1999Cited by 2
<title>Determination of geometric properties of SNOM tips by means of combined far-field and near-field evaluation</title>Soenke Seebacher, Nikolay B. Voznesensky, Wolfgang Osten et al.|Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE|1999Cited by 1