Inspection of nano-sized SNOM-tips by optical far-field evaluation

Soenke Seebacher(Bremen Institute for Applied Beam Technology), N.B. Voznessenski, Wolfgang Osten(University of Stuttgart), Vadim P. Veiko(ITMO University)

Optics and Lasers in Engineering

November 1, 2001

10.1016/s0143-8166(01)00072-0

Cited by 5

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