Determination of layer-thickness variation in periodic multilayer by x-ray reflectivityHui Jiang, Makoto Watanabe, Zhanshan Wang et al.|Journal of Applied Physics|2010Cited by 8
Investigation of defects in sputtered W/B4C multilayersHui Jiang, Aiguo Li, Shuai Yan et al.|Applied Surface Science|2015Cited by 4