Investigation of defects in sputtered W/B4C multilayers
Hui Jiang(Tongji University), Aiguo Li(Shanghai Institute of Applied Physics), Zhaohui Dong(Shanghai Institute of Applied Physics), Jingtao Zhu(Fujian Medical University), Shuai Yan(Shanghai Institute of Applied Physics), Yumei He(Shanghai Institute of Applied Physics), Yi Zheng(Second Affiliated Hospital of Xi'an Jiaotong University)
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