High-speed tapping mode imaging with active <i>Q</i> control for atomic force microscopyTodd Sulchek, D. Adderton, J. P. Cleveland et al.|Applied Physics Letters|2000Cited by 222
Characterization and optimization of scan speed for tapping-mode atomic force microscopyTodd Sulchek, S. C. Minne, G.G. Yaralioglu et al.|Review of Scientific Instruments|2002Cited by 145
Parallel atomic force microscopy with optical interferometric detectionTodd Sulchek, A. Atalar, A. Aydine et al.|Applied Physics Letters|2001Cited by 69