High-speed tapping mode imaging with active <i>Q</i> control for atomic force microscopy
Todd Sulchek(Georgia Institute of Technology), D. Adderton, C. F. Quate(Stanford University), A. Atalar(Bilkent University), Jonathan D. Adams(Stanford University), S. C. Minne(Stanford University), Robert Hsieh(Stanford University), J. P. Cleveland, G.G. Yaralioglu(Stanford University)
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