Fractal analysis and atomic force microscopy measurements of surface roughness for Hastelloy C276 substrates and amorphous alumina buffer layers in coated conductorsFeng Feng, Zhonghe Han, Zhihe Zhao et al.|Applied Surface Science|2011Cited by 35
An orientation competition in yttria-stabilized zirconia thin films fabricated by ion beam assisted sputtering depositionZhi Wang, Zhonghe Han, Zhihe Zhao et al.|Thin Solid Films|2011Cited by 4
Effects of arrival ratio and inclined angle on the orientation competition in ion beam assisting deposited yttria-stabilized zirconia thin filmsZhihe Zhao, Zhonghe Han, Feng Feng et al.|Physica C Superconductivity|2011Cited by 0